产品新闻
产品新闻
2009-06-18
SENDIRA - MIR ellipsometer SENTECHs infrared spectroscopic ellipsometer SENDIRA works with THERMO's FT-IR (6700)
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产品新闻
2009-06-18
SENDURO for 300 mm wafers SENTECH delivers the first SENDURO measurement system for 300 mm silicon wafer applications. The sys
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